{"number":"US12697664B2","kindCode":"B2","documentType":"grant","title":{"original":"Analysis device, analysis method, machining system, and program","english":"Analysis device, analysis method, machining system, and program"},"abstract":{"original":"An analysis device according to the present disclosure analyzes the state of a machining tool. The analysis device includes: an acquisition unit that acquires a measurement result from at least one sensor fitted to the machining tool; a computation unit that performs data processing to the measurement result acquired by the acquisition unit; and an image processing unit that displays a first image and a second image on a display screen, the first image displaying the measurement result acquired by the acquisition unit in time-series, the second image displaying a computation result after the d…","english":"An analysis device according to the present disclosure analyzes the state of a machining tool. The analysis device includes: an acquisition unit that acquires a measurement result from at least one sensor fitted to the machining tool; a computation unit that performs data processing to the measurement result acquired by the acquisition unit; and an image processing unit that displays a first image and a second image on a display screen, the first image displaying the measurement result acquired by the acquisition unit in time-series, the second image displaying a computation result after the d…"},"applicants":["Sumitomo Electric Industries, Ltd."],"inventors":["Akihiro TOYOSHIMA"],"filingDate":"2024-04-16","publicationDate":"2026-08-04","grantDate":"2026-08-04","verifiedWithOffice":true,"pdfUrl":"https://downloadpatent.com/pdf/US12697664B2.pdf","pages":{"en":"https://downloadpatent.com/patent/US12697664B2","zh-Hant":"https://downloadpatent.com/zh-Hant/patent/US12697664B2","ja":"https://downloadpatent.com/ja/patent/US12697664B2"}}