{"number":"US12697779B2","kindCode":"B2","documentType":"grant","title":{"original":"Apparatus, methods, and systems for calibrating 3D printers","english":"Apparatus, methods, and systems for calibrating 3D printers"},"abstract":{"original":"Aspects of apparatus, methods, and systems for calibrating 3D printers are described. One aspect is an apparatus that may comprise: a nozzle support structure that operatively attaches a nozzle to a 3D printer and comprises a strained region that experiences a surface strain of between approximately 1×10-7 and approximately 1×10-4 responsive to a contact between the nozzle and a print surface; and a semiconductor strain gauge that is attached to the strained region and operable to generate an analog signal and output a digital signal responsive to the surface strain, the semiconductor strain g…","english":"Aspects of apparatus, methods, and systems for calibrating 3D printers are described. One aspect is an apparatus that may comprise: a nozzle support structure that operatively attaches a nozzle to a 3D printer and comprises a strained region that experiences a surface strain of between approximately 1×10-7 and approximately 1×10-4 responsive to a contact between the nozzle and a print surface; and a semiconductor strain gauge that is attached to the strained region and operable to generate an analog signal and output a digital signal responsive to the surface strain, the semiconductor strain g…"},"applicants":["PANTHEON DESIGN LTD."],"inventors":["Alex Wiecke","Riley Gunn","Zhenwei Cao"],"filingDate":"2023-07-10","publicationDate":"2026-08-04","grantDate":"2026-08-04","verifiedWithOffice":true,"pdfUrl":"https://downloadpatent.com/pdf/US12697779B2.pdf","pages":{"en":"https://downloadpatent.com/patent/US12697779B2","zh-Hant":"https://downloadpatent.com/zh-Hant/patent/US12697779B2","ja":"https://downloadpatent.com/ja/patent/US12697779B2"}}