美國
US 12,697,050 B2
Apparatus and method for analyte measurement with improved coupling of excitation radiation into material including said analyte
US 12,697,050 B2 是美國專利商標局（USPTO）的核准專利，日期 2026-08-04。申請人：DiaMonTech AG。PDF 可在本頁下載，未登入每天最多 5 篇。
- 申請人
- DiaMonTech AG
- 發明人
- Werner Mäntele; Thorsten Lubinski; Sergius Janik; Michael Kaluza
- 公開日
- 2026-08-04
- 申請日
- 2022-11-17
- 文件種類
- B2 核准公告
- 也寫作
- US 12,697,050 B2 · US12697050 · 12697050
摘要
An apparatus (10) for analyzing a material (12) comprising at least one analyte, said apparatus comprising a measurement body (16) having a contact surface (14) suitable to be brought in thermal contact or pressure-transmitting contact with said material (12), an excitation radiation source (26) configured for irradiating excitation radiation (18) into the material (12) to be absorbed therein, and a detection device for detecting a physical response of the measurement body to heat or a pressure wave received from said material (12) upon absorption of said excitation radiation (18) and for gene…
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專利局網站： 美國專利商標局（USPTO）