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美國

US 12,697,132 B2

Device and method for scar subcision

US 12,697,132 B2 是美國專利商標局(USPTO)的核准專利,日期 2026-08-04。申請人:Indiana University Research and Technology Corporation。PDF 可在本頁下載,未登入每天最多 5 篇。

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申請人
Indiana University Research and Technology Corporation
發明人
Luke G. Gutwein; Rajiv Sood; Barry Davignon
公開日
2026-08-04
申請日
2021-01-11
文件種類
B2 核准公告
也寫作
US 12,697,132 B2 · US12697132 · 12697132

摘要

A scar subcision devices comprising a first elongated element comprising a pivotal connection to a second elongated element, the first elongated element having a blunt distal end, the second elongated element having a proximal-facing cutting edge at a distal end thereof, the device having a first state wherein the cutting edge is retracted to a location within an outer perimeter of the first elongated element, and a second state wherein the cutting edge is exposed outside of the outer perimeter of the first elongated element and the device transitioning between the first state and the second s…

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專利局網站: 美國專利商標局(USPTO)

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