美國
US 12,697,779 B2
Apparatus, methods, and systems for calibrating 3D printers
US 12,697,779 B2 是美國專利商標局（USPTO）的核准專利，日期 2026-08-04。申請人：PANTHEON DESIGN LTD.。PDF 可在本頁下載，未登入每天最多 5 篇。
- 申請人
- PANTHEON DESIGN LTD.
- 發明人
- Alex Wiecke; Riley Gunn; Zhenwei Cao
- 公開日
- 2026-08-04
- 申請日
- 2023-07-10
- 文件種類
- B2 核准公告
- 也寫作
- US 12,697,779 B2 · US12697779 · 12697779
摘要
Aspects of apparatus, methods, and systems for calibrating 3D printers are described. One aspect is an apparatus that may comprise: a nozzle support structure that operatively attaches a nozzle to a 3D printer and comprises a strained region that experiences a surface strain of between approximately 1×10-7 and approximately 1×10-4 responsive to a contact between the nozzle and a print surface; and a semiconductor strain gauge that is attached to the strained region and operable to generate an analog signal and output a digital signal responsive to the surface strain, the semiconductor strain g…
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專利局網站： 美國專利商標局（USPTO）