美國
US 12,697,781 B1
Machine learning for real-time monitoring and control of additive manufacturing
US 12,697,781 B1 是美國專利商標局（USPTO）的核准專利，日期 2026-08-04。申請人：National Technology & Engineering Solutions of Sandia, LLC。PDF 可在本頁下載，未登入每天最多 5 篇。
- 申請人
- National Technology & Engineering Solutions of Sandia, LLC
- 發明人
- Devin John Roach; Andrew Rohskopf; William Derek Reinholtz; Adam Wade Cook; Leah N. Appelhans
- 公開日
- 2026-08-04
- 申請日
- 2023-10-10
- 文件種類
- B1 核准公告
- 也寫作
- US 12,697,781 B1 · US12697781 · 12697781
摘要
A machine learning (ML) approach enables real-time direct ink write (DIW) print-parameter optimization through in-situ monitoring of printed line geometry. The method can use an invertible neural network (INN) to solve both forward and inverse, or optimization, problems using a single network. By combining in-situ computer vision and INNs, DIW printing parameters can be autonomously optimized to print a target line width in a matter of seconds. Furthermore, defects that occur during printing can be rapidly identified and corrected autonomously.…
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專利局網站： 美國專利商標局（USPTO）