美國
US 12,702,373 B2
Providing a complete set of second key elements in an X-ray image
US 12,702,373 B2 是美國專利商標局(USPTO)的核准專利,日期 2026-08-11。申請人:Siemens Healthcare GmbH。PDF 可在本頁下載,未登入每天最多 5 篇。
- 申請人
- Siemens Healthcare GmbH
- 發明人
- Ramyar BINIAZAN; Steffen KAPPLER; Ludwig RITSCHL
- 公開日
- 2026-08-11
- 申請日
- 2023-01-10
- 文件種類
- B2 核准公告
- 也寫作
- US 12,702,373 B2 · US12702373 · 12702373
摘要
A method comprises: applying a first trained function to first input data to generate first output data, the first output data including first key elements; receiving second input data, the second input data being an X-ray image of an examination region acquired using a first collimation region; applying a second trained function to the second input data to generate second output data, the second output data including second key elements; receiving third input data in response to an incomplete set of second key elements, the third input data including the second key elements and an X-ray image…
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專利局網站: 美國專利商標局(USPTO)