United States
US 12,697,779 B2
Apparatus, methods, and systems for calibrating 3D printers
US 12,697,779 B2 is a granted patent from the United States Patent and Trademark Office (USPTO), dated 2026-08-04. Applicant: PANTHEON DESIGN LTD. Its PDF downloads from this page without an account, up to 5 a day.
- Applicant
- PANTHEON DESIGN LTD.
- Inventors
- Alex Wiecke; Riley Gunn; Zhenwei Cao
- Publication date
- 2026-08-04
- Filing date
- 2023-07-10
- Document type
- B2 Granted patent
- Also written as
- US 12,697,779 B2 · US12697779 · 12697779
Abstract
Aspects of apparatus, methods, and systems for calibrating 3D printers are described. One aspect is an apparatus that may comprise: a nozzle support structure that operatively attaches a nozzle to a 3D printer and comprises a strained region that experiences a surface strain of between approximately 1×10-7 and approximately 1×10-4 responsive to a contact between the nozzle and a print surface; and a semiconductor strain gauge that is attached to the strained region and operable to generate an analog signal and output a digital signal responsive to the surface strain, the semiconductor strain g…
The opening of the abstract. The full text is in the PDF.
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Patent office website: United States Patent and Trademark Office (USPTO)
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